Semiconductor package and manufacturing method thereof

ABSTRACT

A semiconductor package has central region and peripheral region surrounding central region. The semiconductor package includes dies, encapsulant, and redistribution structure. The dies include functional die and first dummy dies. Functional die is disposed in central region. First dummy dies are disposed in peripheral region. Redistribution structure is disposed on encapsulant over the dies, and is electrically connected to functional die. Vacancy ratio of central region is in the range from 1.01 to 3.00. Vacancy ratio of the peripheral region is in the range from 1.01 to 3.00. Vacancy ratio of central region is a ratio of total area of central region to total area occupied by dies disposed in central region. Vacancy ratio of peripheral region is a ratio of total area of peripheral region to total area occupied by first dummy dies disposed in peripheral region.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation application of and claims thepriority benefit of a prior application Ser. No. 17/192,897, filed onMar. 5, 2021. The entirety of the above-mentioned patent applications ishereby incorporated by reference herein and made a part of thisspecification.

BACKGROUND

Semiconductor devices and integrated circuits used in a variety ofelectronic apparatus, such as cell phones and other mobile electronicequipment, are typically manufactured on a single semiconductor wafer.The dies of the wafer may be processed and packaged with othersemiconductor devices or dies at the wafer level, and varioustechnologies and applications have been developed for wafer levelpackaging. Integration of multiple semiconductor devices has become achallenge in the field. To respond to the increasing demand forminiaturization, higher speed, and better electrical performance (e.g.,lower transmission loss and insertion loss), more creative packaging andassembling techniques are actively researched.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1A to FIG. 1I are schematic cross-sectional views of structuresproduced at various stages of a manufacturing method of a semiconductorpackage according to some embodiments of the present disclosure.

FIG. 1J is a schematic cross-sectional view of a semiconductor deviceaccording to some embodiments of the present disclosure.

FIG. 2A and FIG. 2B are schematic perspective views of warpedreconstructed wafers according to some embodiments of the presentdisclosure

FIG. 3A is a schematic cross-sectional view of a semiconductor packageaccording to some embodiments of the present disclosure.

FIG. 3B and FIG. 3C are schematic cross-sectional views of portions ofthe semiconductor package of FIG. 3A according to some embodiments ofthe present disclosure.

FIG. 4A to FIG. 4F are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 5A to FIG. 5D are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 6A to FIG. 6D are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 7A to FIG. 7D are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 8A to FIG. 8D are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 9A to FIG. 9D are schematic cross-sectional views of semiconductorpackages according to some embodiments of the present disclosure.

FIG. 10A to FIG. 10D are schematic cross-sectional views ofsemiconductor packages according to some embodiments of the presentdisclosure.

FIG. 11 is a schematic cross-sectional view of a semiconductor packageaccording to some embodiments of the present disclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Other features and processes may also be included. For example, testingstructures may be included to aid in the verification testing of the 3Dpackaging or 3DIC devices. The testing structures may include, forexample, test pads formed in a redistribution layer or on a substratethat allows the testing of the 3D packaging or 3DIC, the use of probesand/or probe cards, and the like. The verification testing may beperformed on intermediate structures as well as the final structure.Additionally, the structures and methods disclosed herein may be used inconjunction with testing methodologies that incorporate intermediateverification of known good dies to increase the yield and decreasecosts.

FIG. 1A through FIG. 1I are schematic cross-sectional views ofstructures produced at various stages of a manufacturing method of asemiconductor package SP1 according to some embodiments of the presentdisclosure. Referring to FIG. 1A, a carrier 100 is provided. In someembodiments, the carrier 100 is a glass substrate, a metal plate, aplastic supporting board, or the like, but other suitable substratematerials may be used as long as the materials are able to withstand thesubsequent steps of the process. In some embodiments, a de-bonding layer(not shown) is provided on the carrier 100 to facilitate peeling thecarrier 100 away from the structure when required by the manufacturingprocess. In some embodiments, the de-bonding layer includes alight-to-heat conversion (LTHC) release layer. In some embodiments, anadhesive layer 110 is formed on the carrier 100, for example vialamination. The adhesive layer 110 may include a die attach filmmaterial, such as a pressure adhesive, a thermally curable adhesive, orthe like.

In some embodiments, referring to FIG. 1B, semiconductor dies 210, 220are provided on the carrier 100. In some embodiments, the semiconductordies 210, 220 are placed onto the carrier 100 through a pick-and-placemethod.

In some embodiments, an individual semiconductor die 210 includes asemiconductor substrate 212, contact pads 214, and a protective layer216. The contact pads 214 are formed at the top surface 212 t of thesemiconductor substrate 212. The protective layer 216 covers the topsurface 212 t of the semiconductor substrate 212 left exposed by thecontact pads 214. In some embodiments, the protective layer 216 furtherextends on portions of the contact pads 214.

The semiconductor substrate 212 may be made of semiconductor materials,such as semiconductor materials of the groups III-V of the periodictable. In some embodiments, the semiconductor substrate 212 includeelemental semiconductor materials, such as crystalline silicon, diamond,or germanium; compound semiconductor materials such as silicon carbide,gallium arsenide, indium arsenide, or indium phosphide, or alloysemiconductor materials such as silicon germanium, silicon germaniumcarbide, gallium arsenic phosphide, or gallium indium phosphide. In someembodiments, the material of the contact pads 214 includes aluminum,copper, copper alloys, or other conductive materials, and may be formedby deposition, plating, or other suitable techniques. The protectivelayer 216 may be a single layer or a multi-layered structure, and mayinclude silicon oxide, silicon nitride, silicon oxy-nitride, othersuitable dielectric materials, or combinations thereof. The protectivelayer 216 may be formed by suitable fabrication techniques such asspin-on coating, chemical vapor deposition (CVD), or the like. In someembodiments, the protective layers 216 may cover the contact pads 214and (temporarily) constitute the front surfaces 210 f of thesemiconductor dies 210.

The semiconductor dies 220 may have a similar structure as the one justdescribed for the semiconductor dies 210. Briefly, each semiconductordie 220 may include a semiconductor substrate 222 having contact pads224 formed on a top surface 222 t, and a protective layer 226 coveringthe contact pads 224 and (temporarily) constituting the front surface220 f of the semiconductor die 220. In some embodiments, thesemiconductor dies 220 may have a different shape (e.g., a differentfootprint) than the semiconductor dies 210. For example, thesemiconductor dies 210 may have a square footprint, and thesemiconductor dies 220 may have a rectangular footprint. However, thedisclosure is not limited thereto.

In some embodiments, the semiconductor dies 210, 220 are placed over thecarrier 100 with the front surfaces 210 f, 220 f facing away from thecarrier 100. Corresponding rear surfaces 210 r, 220 r opposite to thefront surfaces 210 f may be directed towards (and, possibly, in contactwith) the adhesive layer 110. Each semiconductor die 210, 220 mayindependently be or include a logic die, such as a central processingunit (CPU) die, a graphic processing unit (GPU) die, a micro controlunit (MCU) die, an input-output (I/O) die, a baseband (BB) die, or anapplication processor (AP) die, an analog die, a photonic device, or thelike. In some embodiments, some semiconductor dies 210, 220 may bememory dies, for example configured as dynamic random-access memories(DRAMs), resistive random-access memories (RRAMs), static random-accessmemories (SRAMs), magneto-resistive random-access memories (MRAMs),ferroelectric random-access memories (FRAMs), read-only memory (ROM) orthe like. In some embodiments, some of the semiconductor dies 210, 220may be or include passive devices, such as capacitors (e.g., multi-layerceramic capacitors), integrated passive devices, inductors, resistors,filters, transformers, and the like. The disclosure is not limited bythe type or number of semiconductor dies 210, 220.

Referring to FIG. 1C, in some embodiments, dummy dies 300 are disposedover the carrier 100 beside the semiconductor dies 210, 220. In someembodiments, the dummy dies 300 are blocks including semiconductormaterials, such as semiconductor materials of the groups III-V of theperiodic table. In some alternative embodiments, the dummy dies 300 mayinclude an inorganic material. In some embodiments, the inorganicmaterial includes a metal such as copper or copper alloys, aluminum oraluminum alloys, or a combination thereof. In some embodiments, theinorganic material includes a ceramic material. In some embodiments, theinorganic material includes a glass material containing silicon oxide.The dummy dies 300 may be disposed among the semiconductor dies 210,220. In some embodiments, dummy dies 300 of different shapes (e.g.,differing footprints) may be disposed over the carrier 100.

Referring to FIG. 1D, an encapsulant 400 is formed over the carrier 100.In some embodiments, the encapsulant 400 laterally encapsulates thesemiconductor dies 210, 220. In some embodiments, the encapsulant 400includes a molding compound, a molding underfill, a resin (such as anepoxy resin), or the like. In some embodiments, the encapsulant 400 isformed by an over-molding process. In some embodiments, the encapsulant400 is formed by a compression molding process. In some embodiments, theencapsulant 400 may be initially formed so as to cover the frontsurfaces 210 f, 220 f (indicated, e.g., in FIG. 1B) of the semiconductordies 210, 220. Thereafter, a portion of the encapsulant 400 is removed,for example by a planarization process, until the contact pads 214, 224of the semiconductor dies 210, 220 are exposed. In some embodiments,portions of the protective layers 216, 226 are removed during theplanarization process to expose the corresponding contact pads 214, 224.In some embodiments, the planarization of the encapsulant 400 includesperforming a mechanical grinding process and/or a chemical mechanicalpolishing (CMP) process. Following planarization, the front surfaces 210f, 220 f of the semiconductor chips 100 may be defined by thecorresponding protective layers 216, 226 and contact pads 214, 224. Thatis, following the planarization step, the contact pads 214, 224 of thesemiconductor chips 210, 220 are exposed and available for electricallyconnecting the semiconductor chips 210, 220 to subsequently formedcomponents or elements. In some embodiments, the front surfaces 210 f,220 f of the semiconductor chips 210, 220 exposing the contact pads 214,224 are indicated as active surfaces. In some embodiments, the frontsurfaces 210 f, 220 f of the semiconductor chips 210, 220 may besubstantially coplanar with the top surface 400 t of the encapsulant400. In some embodiments, the encapsulant 400 may cover the dummy dies300. That is, the top surfaces 300 t of the dummy dies 300 may be at alevel height such that they remain buried within the encapsulant 400. Insome embodiments, with formation of the encapsulant 400, a reconstructedwafer 500 is obtained.

Referring to FIG. 1E, in some embodiments, a dielectric layer 610 isformed over the reconstructed wafer 500, on top of the encapsulant 400and the semiconductor dies 210, 220. In some embodiments, a material ofthe dielectric layer 610 includes polyimide, epoxy resin, acrylic resin,phenol resin, benzocyclobutene (BCB), polybenzooxazole (PBO), or anyother suitable polymer-based dielectric material. In some embodiments, aprecursor dielectric layer (not shown) may be blanketly formed on thereconstructed wafer 500, for example via spin-coating or suitabledeposition techniques such as chemical vapor deposition (CVD), or thelike. The precursor dielectric layer may be patterned, for example byetching in presence of an auxiliary mask (not shown), to form thedielectric layer 610 including openings OP1. The openings OP1 exposeportions of the contact pads 214, 224 of the semiconductor dies 210,220.

Referring to FIG. 1F, in some embodiments a seed precursor layer 622 ais blanketly formed over the dielectric layer 610. In some embodiments,the seed precursor layer 622 a is conformally formed over the dielectriclayer 610, lining the openings OP1. In some embodiments, the seedprecursor layer 622 a establishes electrical contact with the contactpads 214, 224. The seed precursor layer 622 a may be formed through, forexample, a sputtering process, a physical vapor deposition (PVD)process, an atomic layer deposition (ALD) process, or the like. In someembodiments, the seed precursor layer 622 a may include, for example,copper, tantalum, titanium, a combination thereof, or other suitablematerials. In some embodiments, a barrier layer (not shown) may bedeposited before forming the seed precursor layer 622 a to preventout-diffusion of the material of the seed precursor layer 622 a and thesubsequently formed conductive material 624 a.

In some embodiments, a patterned mask M is provided on the seedprecursor layer 622 a, for example via a sequence of deposition,photolithography, and etching. In some embodiments, a material of thepatterned mask M may include a positive photoresist or a negativephotoresist. In some embodiments, the patterned mask M is patterned toinclude the mask openings MO1. The mask openings MO1 are formed incorrespondence of the openings OP1. That is, the portions of the seedprecursor layer 622 a extending in the openings OP1 are exposed by themask openings MO1, as well as portions of the seed precursor layer 622 aextending on the dielectric layer 610 around the openings OP1. In someembodiments, a conductive material 624 a may be formed on the portionsof seed precursor layer 622 a exposed by the mask openings MO1 of thepatterned mask M. In some embodiments, the conductive material 624 afills the openings OP1 of the dielectric layer 610, and further extendsover the dielectric layer 610 in the mask openings MOL. In someembodiments, the conductive material 624 a may include copper, nickel,tin, palladium, gold, titanium, aluminum, or alloys thereof. In someembodiments, the conductive material 624 a may be formed by a platingprocess. The plating process is, for example, electro-plating,electroless-plating, immersion plating, or the like.

Referring to FIG. 1F and FIG. 1G, the patterned mask M and theunderlying portions of seed precursor layer 622 a may be removed. Insome embodiments, the patterned mask M may be removed or strippedthrough, for example, etching, ashing, or other suitable removalprocesses. Upon removal of the patterned mask M, the portions of seedprecursor layer 622 a that are not covered by the conductive material624 a are removed to render the seed layer 622 and the conductive traces624 of the metallization tier 620. The exposed portions of the seedprecursor layer 622 a may be removed, for example, through an etchingprocess. In some embodiments, the conductive material 624 a may bedifferent from the material of the seed precursor layer 622 a, so theportions of the seed precursor layer 622 a exposed after removal of thepatterned mask M may be removed through selective etching. In someembodiments, the conductive traces 624 may interconnect thesemiconductor dies 210, 220. In some embodiments, the metallizationtiers 620 may include additional metallic traces (not shown) formingseal rings, alignment marks, or the like.

Referring to FIG. 1H, similar process steps to the ones just describedwith reference from FIG. 1E to FIG. 1G may be repeated to form the upperlayers of the redistribution structure 600. As illustrated in FIG. 1H,the redistribution structure 600 includes stacked metallization tiers620. Each metallization tiers 620 is disposed in between adjacentdielectric layers 610. Under-bump metallurgies 630 are optionally formedon the outermost dielectric layer 610 (the dielectric layer 610 furtheraway from the reconstructed wafer 500). The under-bump metallurgies 630may be conformally formed in the openings of the outermost dielectriclayer 610 and further extend over portions of the exposed surface of theoutermost dielectric layer 610. In some embodiments, the under-bumpmetallurgies 630 include multiple stacked layers. For example, theunder-bump metallurgies 630 may include one or more metallic layersstacked on a seed layer. In some embodiments, connective terminals 640are formed on the under-bump metallurgies 630. The connective terminals640 may include solder balls, ball grid array (BGA) connectors, metalpillars, controlled collapse chip connection (C4) bumps, micro bumps,bumps formed via electroless nickel-electroless palladium-immersion goldtechnique (ENEPIG), a combination thereof (e.g., a metal pillar with asolder ball attached), or the like. In some embodiments, the connectiveterminals 640 are micro bumps. The connective terminals 640 areelectrically connected to the semiconductor dies 210, 220 through themetallization tiers 620 of the redistribution structure 600. The dummydies 300 may be electrically insulated from the redistribution structure600 and the connective terminals 640. In some embodiments, thesemiconductor dies 210, 220 connected to the redistribution structure600 may be referred to as functional dies. As illustrated in FIG. 1H,portions of the encapsulant 400 may be interposed between the dummy dies300 and the redistribution structure 600.

Referring to FIG. 1H and FIG. 1I, in some embodiments, the carrier 100and the adhesive layer 110 may be removed to produce the semiconductorpackage SP1, a portion of which is shown in FIG. 1I. In someembodiments, the carrier 100 may be removed by irradiating thede-bonding layer (not shown), and the adhesive layer 110 may be removedby a wet clean process. In some embodiments, the semiconductor packageSP1 includes the reconstructed wafer 500 having the redistributionstructure 600 disposed thereon. While some cutting may be performed atthe edges of the semiconductor package SP1, a singulation step may beomitted. That is, the semiconductor package SP1 may be a large-sizesemiconductor package. For example, the semiconductor package SP1 may bewafer-size semiconductor package. A wafer-size semiconductor package mayhave a circular footprint, with a diameter in the range from 150 mm to300 mm. In some alternative embodiments, the semiconductor package SP1may be a panel-size semiconductor package. The panel-size semiconductorpackage may have a rectangular footprint, for example with an area inthe range from 300×300 mm² to 1000×1000 mm². In some yet alternativeembodiments, the area of the semiconductor package SP1 may be in therange from 2500 mm² to 40000 mm². In some embodiments, the area of thesemiconductor package SP1 may be greater than 10000 mm².

Based on the above, the semiconductor package SP1 includes a pluralityof encapsulated dies. The dies may be functional dies, such as thesemiconductor dies 210, 220, or dummy dies 300. The metallization tiers620 of the redistribution structure 600 may establish directlyelectrical connection to the functional dies, while the dummy dies 300may be electrically disconnected from the redistribution structure 600.

In some embodiments, the semiconductor package SP1 may be integratedinto larger devices, for example the semiconductor device SD1illustrated in FIG. 1J. As illustrated in FIG. 1J, the semiconductordevice SD1 includes the semiconductor package SP1 secured to a heatdissipation plate 710. The heat dissipation plate 710 may be disposed onan opposite side of the reconstructed wafer 500 with respect to theredistribution structure 600. A thermal interface layer 720 may bedisposed in between the reconstructed wafer 500 and the heat dissipationplate 710. For example, the thermal interface layer 720 may contact thesemiconductor dies 210, 220, and keep in thermal exchange thesemiconductor dies 210, 220 and the heat dissipation plate 710. In someembodiments, the thermal interface layer 720 includes an adhesivematerial. In some embodiments, the thermal interface layer 720 includesgrease-based materials, phase change materials, gels, adhesives,polymeric, metallic materials, or a combination thereof. In someembodiments, the thermal interface layer 720 includes lead-tin basedsolder (PbSn), silver paste (Ag), gold, tin, gallium, indium, or othersuitable thermally conductive materials. Depending on the type ofmaterial used, the thermal interface layer 720 may be formed bydeposition, lamination, printing, plating, or any other suitabletechnique. In some embodiments, the thermal interface layer 720 is a geltype material. In some embodiments, the thermal interface layer 720 is afilm type material (e.g., carbon nanotubes or graphite).

In some embodiments, the heat dissipation plate 710 may be secured tothe semiconductor package SP1 through fasteners. For example, throughholes TH may be opened through the semiconductor package SP1, forexample via laser drilling, and screws 730 may be inserted in thethrough holes TH to fix the heat dissipation plate 710 to thesemiconductor package SP1. Braces 740 and nuts 750 may be additionallyused to keep the screws 730 in place. However, the disclosure is notlimited as to the fastening means used, and other types of fasteners(e.g., bolts, clamps, glue, etc.) may also be used.

As illustrated in FIG. 1J, additional dies and devices may be connectedto the redistribution structure 600 of the semiconductor package SP1.For example, the connective terminals 640 may be used to establishelectrical connection to plug connectors 810, additional packages 820,and passive devices 830 on the side of the redistribution structure 600opposite with respect to the reconstructed wafer 500.

FIG. 2A and FIG. 2B are schematic perspective views of warpedsemiconductor packages SP3, SP5 according to some embodiments of thedisclosure. For ease of reference, in FIG. 2A and FIG. 2B areillustrated also the axes X, Y, Z, of a set of orthogonal Cartesiancoordinates. In some embodiments, the semiconductor packages SP3, SP5may be large-size semiconductor packages, including similar componentsas described above for the semiconductor package SP1 of FIG. 1I.Referring to FIG. 1I, FIG. 2A, and FIG. 2B, in some embodiments, duringmanufacturing of the semiconductor packages SP1, SP3, SP5, heating stepsmay be required, for example for curing, soldering, reflowing, or thelike. During these heating steps, the components included in thesemiconductor packages SP1, SP3, SP5 may expand, each one according toits own coefficient of thermal expansion (CTE). For example, componentsmade mostly of semiconductor materials (such as the semiconductor dies210, 220) or metallic materials (such as the metallization tiers 620 orTIVs) may have a different thermal behavior than the dielectricmaterials (e.g., the encapsulant 400, or the dielectric layers 610 ofthe redistributions structure 600). As a result of this difference inthermal behavior, the semiconductor packages SP1, SP3, SP5 may becomedeformed, i.e., warped, along one or more directions. For example, asillustrated in FIG. 2A, the semiconductor package SP3 may undergo“saddle-type” warpage, bending towards the negative Z direction alongthe X direction, and bending towards the positive Z direction along theY direction. In some alternative embodiments, as illustrated in FIG. 2B,the semiconductor package SP5 may undergo “potato-type” or“concentric-type” warpage. In these embodiments, the edges of thesemiconductor package SP5 may deform in the Z direction with respect tothe central region of the semiconductor package SP5. For example, theedge of the semiconductor package SP5 may be located at a higherlevel-height along the Z direction than the central part of thesemiconductor package SP5. In some alternative embodiments, the edge ofthe semiconductor package SP5 may be located at a lower level heightalong the Z direction than the central part of the semiconductor packageSP5. In some embodiments, the deformation of the edge in the Z directionmay happen at a substantially same amount along the X and Y direction(concentric-type warpage). In some alternative embodiments, thedeformation in the Z direction of the edge may be stronger along onedirection (e.g., the X direction) than the other direction (e.g., the Ydirection). In such cases, the warpage is referred to as potato-type. Asillustrated in the embodiments of FIG. 2A and FIG. 2B, the uppersurfaces SP3 u, SP5 u and the lower surfaces SP31, SP5 l of thesemiconductor packages SP3, SP5 may deform out of plane, becomingsignificantly curved. In some embodiments, the height difference(difference in height level) ΔH along the Z direction existing betweenthe highest point and the lowest point of the upper surfaces SP3 u, SP5u or the lower surfaces SP31, SP51 may be taken as a measure of thewarpage of the semiconductor packages SP3, SP5. In FIG. 2A and FIG. 2Bthe height difference ΔH is indicated with respect to the lower surfacesSP31, SP5 l for illustrative purposes. In some alternative embodiments,the height difference ΔH may be considered with respect to the uppersurfaces SP3 u, SP5 u, depending on whichever of the two values isgreater. In some embodiments, excessive warpage (e.g., a too largeheight difference ΔH) of the semiconductor packages SP3, SP5 may renderimpossible performing subsequent steps of the manufacturing process,thus reducing the process yield and increasing the manufacturing costs.As discussed in the following, in some embodiments, warpage of thesemiconductor packages SP3, SP5 may be alleviated by controlling thefan-out ratio of the semiconductor packages SP3, SP5.

FIG. 3A is a schematic cross-sectional view of a semiconductor packageSP10 according to some embodiments of the disclosure. FIG. 3B is anenlarged view of the portion of the semiconductor package SP10 enclosedby the area A illustrated in FIG. 3A. FIG. 3C is an enlarged view of theportion of the semiconductor package SP10 enclosed by the area Billustrated in FIG. 3B. The semiconductor package SP10 may have asimilar structure to the semiconductor package SP1 of FIG. 1I, and maybe manufactured following a similar process as previously described withreference to FIG. 1A to FIG. 1I. The cross-sectional view of FIG. 3A istaken in a XY plane located at a level height along the thicknessdirection (i.e., the Z direction illustrated in FIG. 1I) passing throughthe semiconductor dies 1200, the dummy dies 1310, 1320, and theencapsulant 1400. As illustrated in FIG. 3A, the semiconductor packageSP10 includes semiconductor dies 1200 disposed in an array configuration(e.g., a matrix MT of m rows and n columns). In some embodiments, thesemiconductor dies 1200 may have a square or rectangular footprint. Forexample, a ratio of the length S1 of a side surface extending along afirst direction (e.g., the X direction) to the length S2 of a sidesurface extending along a second direction (e.g., the Y direction) maybe in the range from 0.1 to 10. In some embodiments, the footprint of asemiconductor die 1200 may be in the range from 4 mm² to 900 mm². Forexample, the footprint of the semiconductor die 1200 may be about 625mm². The semiconductor dies 1200 may be disposed towards the centralregion of the semiconductor package SP10.

The semiconductor package SP10 also includes one or more types of dummydies, for example the dummy dies 1310 and 1320. The footprints of thedummy dies 1310, 1320 may independently be in the range between 1 mm²and 900 mm². For example, at least some of the dummy dies 1310, 1320 mayhave a footprint of about 6 mm², 36 mm², or 100 mm². In someembodiments, the semiconductor package SP10 includes two types of dummydies, with the dummy dies 1310 having a larger footprint than the dummydies 1320. In some embodiments, the footprint of the dummy dies 1310 maybe similar (or even substantially equal) to the footprint of thesemiconductor dies 1200. As illustrated in FIG. 3A, the dummy dies 1310may form a square or rectangular ring R1 surrounding the array ofsemiconductor dies 1200. The dummy dies 1320 may be smaller than thedummy dies 1310 and the semiconductor dies 1200. The footprint of thedummy dies 1320 may be square or rectangular. For example, the ratio ofthe length S3 of a side surface extending along a first direction (e.g.,the X direction) to the length S4 of a side surface extending along asecond direction (e.g., the Y direction) may be in the range from 0.1 to10. In some embodiments, the dummy dies 1320 may be disposed around thering R1 of dummy dies 1320, and also in between adjacent dummy dies1310, between adjacent dummy dies 1310 and semiconductor dies 1200, andin between adjacent semiconductor dies 1200. For example, the dummy dies1320 may be disposed in an area of the semiconductor package SP10extending from the ring R1 towards the edge E of the semiconductorpackage SP10. A row of dummy dies 1320 extending along a first direction(e.g., the X direction) may be disposed in between two dummy dies 1310consecutive along a second direction (e.g., the Y direction)perpendicular to the first direction. Similarly, a row of dummy dies1320 extending along a first direction (e.g., the X direction) may bedisposed in between two semiconductor dies 1200 belonging to a same rowor column of the matrix MT and consecutive along a second direction(e.g., the Y direction) perpendicular to the first direction. That is,one or more row of dummy dies 1320 may be disposed in between the rowsand columns of the array of semiconductor dies 1200.

In some embodiments, the dummy dies 1320 located in between thesemiconductor dies 1200 of the matrix MT may be disposed alongintersecting lines. For example, referring to FIG. 3B, the semiconductordies 1200A and 1200B may belong to a same row of the matrix MT, and thesemiconductor dies 1200C and 1200D may belong to an adjacent row of thematrix MT. At the same time, the semiconductor dies 1200A and 1200C maybe considered to belong to a same column of the matrix MT and thesemiconductor dies 1200B and 1200D may be considered to belong to anadjacent column of the matrix MT. The line L1 of dummy dies 1320 extendsalong the same direction as the rows of semiconductor dies 1200A-D(e.g., the X direction), and intersects with the line L2 extending alongthe same direction as the columns of semiconductor dies 1200A-D (e.g.,the Y direction). At the intersection between the two lines L1 and L2,each line L1 or L2 may present a gap G1 or G2, respectively. The gaps G1and G2 may form a through hole space THS in which no die (neither asemiconductor die 1200 nor a dummy die 1310 or 1320) is disposed. Thatis, the through hole spaces THS may be filled by the encapsulant 1400.In some embodiments, the through hole spaces THS may be drilled trough(for example via laser drilling) to form the through holes TH(illustrated in FIG. 1J) when the semiconductor package SP10 isintegrated in larger semiconductor devices (e.g., the semiconductordevice SD1 of FIG. 1J). In some embodiments, each gap G1, G2 mayindependently be in the range from 1000 micrometers to 10000micrometers. For example, the gaps G1 and G2 may be about 5000micrometers.

In some embodiments, the die-to-die spaces D1-D6 between adjacent dummydies 1320 (or between a dummy die 1320 and an adjacent dummy die 1310 orsemiconductor die 1310) may be in the range between 20 micrometers and1000 micrometers. Each of these die-to-die spaces D1-D6 may be variedindependently. For example, the die-to-die spaces D1 and D3 between thedummy dies 1320 located among the semiconductor dies 1200 may be about200 micrometers, the die-to-die spaces D2 and D4 between the dummy dies1320 and the semiconductor dies 1200 or the dummy dies 1310 may be about400 micrometers, and the die-to-die spaces D5 and D6 between dummy dies1320 located between the ring R1 and the edge E may be about 70micrometers. However, the disclosure is not limited thereto. In someembodiments, the distance between consecutive dummy dies 1320 in a lineL1 or L2 may not be constant along the line L1 or L2. For example,proceeding along the line L1, the dummy die 1320A may be separated bythe distance D1 from the dummy die 1320B, and the dummy die 1320G may beseparated by the same distance D1 from the dummy die 1320H. However, thedummy dies 1320B and 1320G (which immediately follows the dummy die1320B along the line L1) may correspond to the gap G1.

In some embodiments, the disposition, the type, and the number of dummydies 1310, 1320 may be varied to reduce the warpage of the semiconductorpackage SP10. FIG. 4A is a schematic cross-sectional view of thesemiconductor package SP10 according to some embodiments of thedisclosure. For clarity of illustration, in FIG. 4A the dummy dies 1320are omitted, while the positions of the dummy dies 1310 are illustratedwith dash-double-dotted lines. The positions of the semiconductor dies1200 are illustrated with solid lines. In some embodiments, it may bepossible to divide the semiconductor package SP10 in two regions, namelya central region C10 and a peripheral region P10. In FIG. 4A, the borderof the central region C10 is illustrated by a dashed line. Theperipheral region P10 is considered the area extending from the borderof the central region C10 to the edge E of the semiconductor packageSP10, and is represented in FIG. 4A as the dotted area. In someembodiments, the central region C10 may coincide with the region of thesemiconductor package SP10 spanned by the semiconductor dies 1200. Forexample, the border of the central region C10 may be defined by theouter surfaces 1200 s of the outermost semiconductor dies 1200 facingthe edge E of the semiconductor package SP10. More specifically, theouter surfaces 1200 s forming the boundary of the central region C10 maybe the ones facing the edge E of the semiconductor package SP10 withoutother semiconductor dies 1200 interposed in between. The outermostsemiconductor dies 1200 may be considered the semiconductor dies 1200closer to the edge E of the semiconductor package SP10 considering theradial directions of the semiconductor package SP10 (i.e., thedirections of the radii R10). For example, when the semiconductor dies1200 are disposed in an array configuration such as the matrix MT, theoutermost semiconductor dies 1200 may be the semiconductor dies 1200disposed forming the sides of the matrix MT (the outer ring of thematrix), and the border between the central region C10 and theperipheral region P10 may coincide with the perimeter of the matrix MT.

In some embodiments, the semiconductor package SP10 may be a wafer-sizesemiconductor package, and have a circular footprint of radius R10. Insome embodiments, the peripheral region P10 may be located at the outerarea of the semiconductor package SP10, for example spanning 25 to 40%of the radius R10. That is, the radius (or the radial width) RP10 of theperipheral region P10 measured along the radius R10 of the semiconductorpackage may correspond to 25 to 40% of the radius R10. The remainingpart of the radius R10 may correspond to the radial width RC10 of thecentral region C10. However, the disclosure is not limited thereto. Forexample, in some alternative embodiments, the radius RC10 of the centralregion C10 may be between ⅓ and ⅔ of the radius R10 of the semiconductorpackage SP10. In some embodiments, the total area of the central regionC10 may be between 5% to 50% of the total area of the semiconductorpackage SP10. For example, as illustrated in FIG. 4B, the semiconductorpackage SP11 may include fewer semiconductor dies 1200 and more dummydies 1310 than the semiconductor package SP10. The central region C11 ofthe semiconductor package SP11 may be smaller (cover a smaller area)than the central region C10 of the semiconductor package SP10. In someembodiments, the semiconductor dies 1200 may be still disposed in anarray configuration, for example forming the matrix MT2, and the dummydies 1310 may form an inner ring JR and an outer ring OR around thematrix MT2. That is, the dummy dies 1310 may be disposed alongconcentric rings around the matrix MT2. In some alternative embodiments,as illustrated for the semiconductor package SP12 in FIG. 4C, moresemiconductor dies 1200 than the ones illustrated in FIG. 4A or FIG. 4Bmay be included, and the corresponding central region C12 may extendfurther towards the edge E of the semiconductor package with respect tothe central regions C10 or C11. In some embodiments, the matrix MT3 ofsemiconductor dies 1200 may occupy the same space occupied by thesemiconductor dies 1200 and the dummy dies 1310 in the semiconductorpackages SP10 or SP11, so that no dummy dies 1310 are included in thesemiconductor package SP12. Smaller dummy dies (e.g., the dummy dies1320 illustrated in FIG. 3A), may however be included both in thecentral region C12 and in the peripheral region P12. As illustrated inFIG. 4A, in some embodiments the central region C10 may have a differentshape than the footprint of the semiconductor package SP10. For example,the central region C10 is rectangular, while the semiconductor packageSP10 has a circular footprint. If one of the central region C10 or thesemiconductor package SP10 is rectangular (e.g., having an elongatedrectangle or a square footprint), the radial width RP10 is measured incorrespondence of the diagonal of the rectangular shape. In theembodiment illustrated in FIG. 4A, the radial width RC10 of the centralregion C10 corresponds to the half of the diagonal of the central regionC10.

In some embodiments, the warpage of the semiconductor package SP10 maybe at least partially controlled or reduced by tuning the vacancy ratiosC10′ and P10′ (vacancy ratios) of the central region C10 and theperipheral region P10. The vacancy ratio of a region of thesemiconductor package SP10 may be defined as the ratio between the totalarea of the region under consideration and the area occupied by the dies(e.g., the functional semiconductor dies 1200 and the dummy dies 1310,1320) included within the region under consideration. That is, thevacancy ratio may be considered as the inverse of the fraction of thearea of the region under consideration occupied by dies (functional anddummy) included in the region under consideration. Generally, thevacancy ratio O′ of a region may be calculated according to the formula(1) below:

$\begin{matrix}{O^{\prime} = \frac{A_{tot}}{A_{die}}} & (1)\end{matrix}$

In formula (1), A_(tot) is the total area of the region underconsideration, and A_(die) is the total area occupied by the dies(functional and dummy) included in the region under consideration,namely:A _(die)=Σ_(i) N _(i) A _(Di)  (2).

In formula (2), N refers to the numbers of die included in the regionunder consideration, A_(D) refers to the area covered by an individualdie, and the index i runs over the different types of dies included inthe region under consideration. Other elements which may be included inthe region (e.g., TIVs, not shown) do not appear in the denominator. Forexample, with respect to the central region C10 in FIG. 4A, the vacancyratio C10′ of the central region C10 may be evaluated according toformula (3).

$\begin{matrix}{{C10^{\prime}} = {\frac{A_{C10}}{{N_{1200}A_{1200}} + {N_{1320,{C10}}A_{1320}}}.}} & (3)\end{matrix}$

In formula (3), A_(C10) corresponds to the total area of the centralregion C10 (the area enclosed by the dashed line in FIG. 4A), A₁₂₀₀ isthe area of an individual semiconductor die 1200, N₁₂₀₀ is the number ofsemiconductor dies 1200 in the central region C10, A₁₃₂₀ is the area ofan individual dummy die 1320 (illustrated, e.g., in FIG. 3B), andN_(1320,C10) is the number of dummy dies 1320 included in the centralregion C10. The dummy dies 1310 and the dummy dies 1320 disposed outsidethe central region C10 do not appear in the evaluation of the vacancyratio C10′ of the area C10.

Following a similar logic, it is possible to define the vacancy ratioP10′ for the peripheral region P10, according to formula (4) below.

$\begin{matrix}{{P10^{\prime}} = {\frac{A_{P10}}{{N_{1310}A_{1310}} + {N_{1320,{P10}}A_{1320}}}.}} & (4)\end{matrix}$

In formula (4), appear the areas (A₁₃₁₀ and A₁₃₂₀) and the numbers(N₁₃₁₀ and N_(1320,P10)) of the dummy dies 1310 and 1320 included in theperipheral region P10, respectively. The total area A_(P10) of theperipheral region P10 corresponds to the area (illustrated as a dottedarea) extending from the border of the central region C10 to the edge Eof the semiconductor package SP10.

In some embodiments, each of the vacancy ratios C10′ and P10′ mayindependently be in the range from 1.01 and 3.00. For example, for thesemiconductor package SP10, the vacancy ratio C10′ may be about 1.1, andthe vacancy ratio P10′ may be about 1.02. That is, the vacancy ratiosC10′ and P10′ may differ with respect to each other. However, thedisclosure is not limited thereto. In some embodiments, the ratio of thevacancy ratio C10′ of the central region C10 to the vacancy ratio P10′of the peripheral region P10 may be in the range from 0.3 to 3.0. Insome embodiments, the ratio of the vacancy ratio C10′ to the vacancyratio P10′ may be in the range from 0.5 to 2. In some embodiments, whenthe ratio of the vacancy ratios C10′ to P10′ is in the above range,warpage of the semiconductor package SP10 may be reduced, thusincreasing the manufacturing yield and the reliability of thesemiconductor package SP10. In some embodiments, the vacancy ratios C10′and P10′ may be fine-tuned by careful disposition of the dummy dies1310, 1320, without need to rearrange the functional semiconductor dies1200 nor the routing of the redistribution structure. Therefore,reduction of the warpage of the semiconductor package SP10 may beachieved while avoiding costly modifications to the design of the masksused for the fabrication of the redistribution structure.

FIG. 4D is a schematic cross-sectional view of a semiconductor packageSP13 according to some embodiments of the disclosure. Thecross-sectional view of FIG. 4D is taken in a corresponding plane as thecross-sectional view of FIG. 4A. Also, in FIG. 4D are illustrated thefootprints of the semiconductor dies 1200 and the dummy dies 1310, whilethe footprints of the dummy dies 1320 are omitted for clarity ofillustration. In some embodiments, the disposition of the semiconductordies 1200 and the dummy dies 1320 in the semiconductor package SP13 maybe the same as the one illustrated in FIG. 3A for the semiconductorpackage SP10. In some embodiments, the semiconductor package SP13 mayhave a similar structure to the semiconductor package SP10 of FIG. 3Aand FIG. 4A, and may be manufactured following a similar process aspreviously described with reference to FIG. 1A to FIG. 1I. In someembodiments, a difference between the semiconductor package SP13 and thesemiconductor package SP10 lies in the extension of the central regionC13. That is, the semiconductor package SP13 may have a larger centralregion C13. For example, the central region C13 may be a circle ofradius RC12 (illustrated as a dashed line), and the peripheral regionP13 may be the annular region of radial width RP13 between the boundaryof the central region C13 and the edge E of the semiconductor packageSP13. The relationship between the radial width RP13 of the peripheralregion P13, the radius RC13 of the central region C13, and the radiusR13 of the semiconductor package SP13 may be the same as described abovewith respect to the semiconductor package SP10. In some embodiments,some of the dummy dies 1310 may be disposed within the central regionC13, to achieve a desired vacancy ratio C13′. Furthermore, dummy dies1330 may be disposed in place of some of the dummy dies 1310 withrespect to the disposition of the dies in the semiconductor packageSP13. The dummy dies 1330 may have a footprint intermediate between thedummy dies 1310 and the dummy dies 1320. That is, the dummy dies 1330may be larger than the dummy dies 1320 and smaller than the dummy dies1310. In some embodiments, the dummy dies 1330 may be used to furthertune the vacancy ratio C13′ of the central region C13 and/or the vacancyratio P13′ of the peripheral region P13. For example, the dummy dies1330 may be disposed in spaces between the boundary of the centralregion C13 and the semiconductor dies 1200 too narrow to accommodate alarger dummy die 1310.

In some embodiments, the disposition of the functional semiconductordies 1200 may be determined as a function of the desired interconnectionin the finished semiconductor package SP13, for example taking intoaccount number, shape, and function of the individual semiconductor dies1200, and the required routing in the overlying redistributionstructure. Once the position of the semiconductor dies 1200 and therouting of the redistribution structure is optimized, the shape and theextension of the central region C13 (and, hence, of the peripheralregion P13) may be established. Thereafter, the vacancy ratios C13′ andP13′ of the two regions C13 and P13 may be tuned by disposing the dummydies in empty spaces within the regions C13 and P13. For example, asillustrated in FIG. 4D, the central region C13 may extend furthertowards the edge E of the semiconductor package SP13 with respect to theoutermost semiconductor dies 1200, and some additional dummy dies (e.g.,1310, 1330) may be disposed in the space between the outermostsemiconductor dies 1200 and the boundary of the central region C13 toachieve the desired vacancy ratio C13′. In some embodiments, thedisposition of the dummy dies may be optimized through simulations ofthe manufacturing process, to determine which disposition of the dummydies minimizes the warpage of the manufacturing intermediate(s) and/orthe final product.

FIG. 4E is a schematic cross-sectional view of a semiconductor packageSP14 according to some embodiments of the disclosure. Thecross-sectional view of FIG. 4E is taken in a corresponding plane as thecross-sectional view of FIG. 4A. Also, in FIG. 4E are illustrated thefootprints of the semiconductor dies 1200 and the dummy dies 1310, whilethe footprints of the dummy dies 1320 are omitted for clarity ofillustration. In some embodiments, the semiconductor package SP14 mayhave a similar structure to the semiconductor package SP10 of FIG. 3Aand FIG. 4A and SP13 of FIG. 4D, and may be manufactured following asimilar process as previously described with reference to FIG. 1A toFIG. 1I. In some embodiments, a difference between the semiconductorpackage SP14 and the semiconductor packages SP10 and SP13 lies in thenumber of functional semiconductor dies 1200 included. For example, thesemiconductor package SP14 may include a number of semiconductor dies1200 not sufficient to fill a square or rectangular array, or thedesired routing is such that not all the semiconductor dies 1200 may bepositioned in a square or rectangular array. For example, as illustratedin FIG. 4E, the majority of the semiconductor dies 1200 may be disposedin a square array in the central region C14, while other semiconductordies 1200 may be disposed along the sides (e.g., three sides) of thesquare. Furthermore, the semiconductor dies 1200 disposed along thesides of the square may extend for only a portion of the side. Forexample, the square may be a 5×5 array, but only three semiconductordies 1200 may be disposed outside the array along the sides of thearray. As illustrated in FIG. 4E, the central region C14 is not limitedto have regular shapes as the central regions C13 and C10 of thesemiconductor packages SP13 and SP10, respectively, but can also haveirregular shapes. When the central region C14 has an irregular shape,the radial width RP14 of the peripheral region P14 is evaluated at thepoint of maximum radial extension of the central region C14. That is,the radial width RP14 of the peripheral region RP14 is evaluated at thepoint of minimum distance between the boundary of the central region C14and the edge E of the semiconductor package SP14. In some embodiments,the radial width RP14 may be within 25 to 40% of the correspondingradius R14. In some alternative embodiments, the radial width RC14 ofthe central region may be between ⅓ to ⅔ of the radius R14 of thesemiconductor package SP14. In some embodiments, the central region C14of the semiconductor package SP14 is defined by the outer surfaces 1200s of the outermost semiconductor dies 1200. Particularly, the outersurfaces 1200 s considered are the ones facing the edge E of thesemiconductor package SP14 without other semiconductor dies 1200interposed in between. The outermost semiconductor dies 1200 areconsidered the ones radially closer to the edge E of the semiconductorpackage P14, for example, the semiconductor dies 1200 closer to the edgeE along the directions of the radii R14.

FIG. 4F is a schematic cross-sectional view of a semiconductor packageSP16 according to some embodiments of the disclosure. Thecross-sectional view of FIG. 4F is taken in a corresponding plane as thecross-sectional view of FIG. 4A. Also, in FIG. 4F are illustrated thefootprints of the semiconductor dies 1200 and the dummy dies 1310, whilethe footprints of the dummy dies 1320 are omitted for clarity ofillustration. However, in some embodiments, the disposition of thesemiconductor dies 1200 and the dummy dies 1310, 1320, 1330 in thesemiconductor package SP16 may be the same as the one illustrated inFIG. 4D for the semiconductor package SP13. In some embodiments, thesemiconductor package SP16 may have a similar structure to thesemiconductor package SP13 of FIG. 4D, and may be manufactured followinga similar process as previously described with reference to FIG. 1A toFIG. 1I. In some embodiments, a difference between the semiconductorpackage SP16 and the semiconductor package SP13 lies in thesemiconductor package SP16 being a panel-size semiconductor package,rather than a wafer-size semiconductor package. That is, thesemiconductor package SP16 may have a rectangular footprint. In thesemiconductor package SP16, the radial width RP16 of the peripheralregion P16 is measured in correspondence of the diagonal R16 of therectangular footprint. In some embodiments, the radial width RP16 is 25to 40% the length of the diagonal R16. The remaining portion maycorrespond to the radius (radial width) RC16 of the central region C16,which, in some embodiments, has a circular shape. In some alternativeembodiments, the radial width RC16 of the central region C16 may bebetween ⅓ to ⅔ of the diagonal R16.

FIG. 5A is a schematic cross-sectional view of a semiconductor packageSP20 according to some embodiments of the disclosure. Thecross-sectional view of FIG. 5A is taken in a corresponding XY plane asthe cross-sectional view of FIG. 4A. The semiconductor package SP20 mayhave a similar structure as the semiconductor package SP10 of FIG. 4A,and be manufactured following a similar process as described above withrespect to FIG. 1A to FIG. 1I. In some embodiments, the semiconductorpackage SP20 includes a single functional semiconductor die 2200 in thecircular central region C20. For example, the semiconductor die 2200 maybe a System-on-Chip type of die, integrating multiple functionalities indifferent areas of the die. In some embodiments, the semiconductor die2200 may be the only die included in the central region C20. Therefore,the vacancy ratio C20′ of the central region C20 may be determined bythe area A₂₂₀₀ of the semiconductor die 2200 and the area A_(C20)covered by the conductive traces of the redistribution structure(illustrated, e.g., in FIG. 4A). In some embodiments, the semiconductorpackage SP20 further includes the dummy dies 2310 in the peripheralregion P20. In some embodiments, the dummy dies 2310 may be disposed inone or more rings surrounding the central region C20. In someembodiments, the dummy dies 2310 are all disposed in the peripheralregion P20. That is, there may be no dummy dies 2310 in the centralregion C20. However, the disclosure is not limited thereto. In somealternative embodiments, the dummy dies 2310 may also be included in thecentral region C20.

In some embodiments, when a single functional die such as thesemiconductor die 2200 is included as in the semiconductor package SP20,the central region C20 extends further than the span of thesemiconductor die 2200. In some embodiments, the central region C20 maybe circular (substantially round or elliptical, for example), orrectangular, and be centered on a central point C of the semiconductorpackage SP20. For example, for a wafer-size semiconductor package as thesemiconductor package SP20, the central region C20 may be circular, anda center of the central region C20 may coincide with the central point Cof the semiconductor package SP20. In some alternative embodiments, thecentral region may be rectangular (square or elongated), and thediagonals of the central region may intersect at the central point C. Insome yet alternative embodiments, the axes of an elliptical centralregion may intersect at the central point C. In some embodiments, thecentral region C20 may extend in between 5% to 50% of the total area ofthe semiconductor package SP20. For example, the area of the centralregion C20 may be 5%, 10%, 15%, 20%, 25%, 30%, 35%, 40%, 45%, or 50% ofthe total area of the semiconductor package SP20. In some embodiments,the area of the central region C20 may be about 20% to 40% larger thanthe area of the single functional die 2200. For example, the area of thecentral region C20 may be 20%, 25%, 30%, 35%, or 40% larger than thearea of the single functional die 2200.

In some embodiments, it may be desirable to fine-tune the vacancy ratioP20′ of the peripheral region P20, for example to reduce the warpage ofthe semiconductor package SP20. In some embodiments, it may be desirablefor cost management or production requirements to change the ratio ofthe vacancy ratios C20′ to P20′ without changing the vacancy ratio C20′.In some embodiments, the vacancy ratio P20′ of the peripheral region P20may be fine-tuned by changing the number of dummy dies 2310 included.For example, as illustrated for the semiconductor package SP22 of FIG.5B, a vacancy ratio P22′ higher than the vacancy ratio P20′ may beachieved by reducing the number of dummy dies 2310 included in theperipheral region P22. In some alternative embodiments, as illustratedfor the semiconductor package SP24 in FIG. 5C, a vacancy ratio P24′equal to the vacancy ratio P22′ may be achieved by including a smallernumber of larger dummy dies 2320 in the peripheral region P24. Forexample, in the semiconductor package SP24 dummy dies 2320 of largerfootprint may be used in place of the dummy dies 2310 included in thesemiconductor packages SP20 and SP22. In some yet alternativeembodiments, as illustrated for the semiconductor package SP26 in FIG.5D, a combination of the smaller dummy dies 2310 and the larger dummydies 2320 may be included in the peripheral region P26 to fine-tune thevacancy ratio P26′. For example, an outer ring OR of smaller dummy dies2310 may be disposed closer to the edge E of the semiconductor packageSP26 and an inner ring IR of larger dummy dies 2320 may be disposedbetween the outer ring OR and the border of the central region C20. Insome embodiments, the central regions C20, C22, C24, C26 of thesemiconductor packages SP20, SP22, SP24, SP26 may have the same vacancyratios C20′, C22′, C24, C26′. In some embodiments, the central regionsC20, C22, C24, C26 are identical with respect to each other.Furthermore, the vacancy ratios P22, P24′, P26′ may be equal withrespect to each other and smaller than the vacancy ratio P20′. That is,in the semiconductor packages SP22, SP24, SP26 the same vacancy ratioP22′, P24, or P26′ may be achieved by varying the number and size of thedummy dies 2310, 2320 without changing the layout of the central regionsC20, C22, C24, C26.

FIG. 6A to FIG. 6D are schematic cross-sectional views of thesemiconductor packages SP30, SP32, SP34, SP36, respectively, accordingto some embodiments of the disclosure. The cross-sectional views of FIG.6A to FIG. 6D are taken in the same XY plane as the cross-sectionalviews of FIG. 5A to FIG. 5D. In some embodiments, a difference betweenthe semiconductor packages SP30, SP32, SP34, SP36 and the semiconductorpackages SP20, SP22, SP24, SP26 of FIG. 5A to FIG. 5D lies in that thesemiconductor packages SP30, SP32, SP34, SP36 are panel-sizesemiconductor packages, having a rectangular footprint. As illustratedin FIG. 6A, the semiconductor package SP30 includes the semiconductordie 3200 in the (rectangular) central region C30, and the dummy dies3310 in the peripheral region P30. The dummy dies 3310 may be disposedin the peripheral region P30 surrounding the central region C30, forexample forming one or more rings outside the central region C30. Insome embodiments, the dummy dies 3310 may be confined within theperipheral region P30. That is, no dummy dies 3310 are included in thecentral region C30. However, the disclosure is not limited thereto, andin some alternative embodiments, dummy dies 3310 may be included in thecentral region C30.

Similar to what was previously discussed with respect to FIG. 5A to FIG.5D, in some embodiments, when a single functional die such as thesemiconductor die 3200 is included as in the semiconductor package SP30,the central region C30 may extend further than the span of thesemiconductor die 3200. In some embodiments, the central region C30 maybe circular (substantially round or elliptical, for example), orrectangular, and be centered on a central point C of the semiconductorpackage SP30. For example, for a panel-size semiconductor package as thesemiconductor package SP30, the central point C may correspond to theintersection of the diagonals (dashed lines in FIG. 6A) of the footprintof the semiconductor package SP30. In some the central region C30 may berectangular, and the diagonals of the central region C30 may intersectat the central point C of the semiconductor package SP30. In somealternative embodiments, the central region may be circular, and thecenter of the central region may be located at the central point C. Insome yet alternative embodiments, the axes of an elliptical centralregion may intersect at the central point C. In some embodiments, thecentral region C30 may extend in between 5% to 50% of the total area ofthe semiconductor package SP30. For example, the area of the centralregion C30 may be 5%, 10%, 15%, 20%, 25%, 30%, 35%, 40%, 45% or 50% ofthe total area of the semiconductor package SP30. In some embodiments,the area of the central region C30 may be about 10% to 30% larger thanthe area of the single functional die 3200. For example, the area of thecentral region may be 10%, 15%, 20%, 25%, or 30% larger than the area ofthe single functional die 3200.

In some embodiments it may be possible to tune the vacancy ratios P32′,P34′, P36′ of the peripheral regions P32, P34, P36 by varying the numberand the size of the dummy dies 3310, similar to what was previouslydescribed with reference to FIG. 5B to FIG. 5D. For example, thesemiconductor package SP32 includes fewer dummy dies 3310 further spacedapart from each other with respect to the dummy dies 3310 in thesemiconductor package SP30. As another example, the semiconductorpackage SP34 includes fewer dummy dies 3320 with respect to the numberof dummy dies 3310 included in the semiconductor package SP30. The dummydies 3320 have a larger footprint with respect to the dummy dies 3310included in the semiconductor packages SP30 and SP32. In yet anotherexample, the semiconductor package SP36 includes both the dummy dies3310 and the dummy dies 3320. For example, an outer (rectangular) ringOR (a frame) of smaller dummy dies 3310 may be disposed closer to theedge E of the semiconductor package SP36, and an inner (rectangular)ring IR (a frame) of larger dummy dies 3320 may be disposed between theouter ring OR and the border of the central region C36.

FIG. 7A to FIG. 7D are schematic cross-sectional views of thesemiconductor packages SP40, SP42, SP44, SP46, respectively, accordingto some embodiments of the disclosure. The cross-sectional views of FIG.7A to FIG. 7D are taken in the same XY plane as the cross-sectionalviews of FIG. 5A to FIG. 5D. In some embodiments, a difference betweenthe semiconductor packages SP40, SP42, SP44, SP46 and the semiconductorpackages SP20, SP22, SP24, SP26 of FIG. 5A to FIG. 5D lies in that thesemiconductor packages SP40, SP42, SP44, SP46 includes multiplefunctional semiconductor dies 4200 within the central regions C40, C42,C44, C46. The sizes and functions of the semiconductor dies 4200 mayindependently vary with respect to each other. As illustrated, forexample, in FIG. 7A, the semiconductor package SP40 is a wafer-sizesemiconductor package including the semiconductor die 4200 in thecentral region C40, and the dummy dies 4310 in the peripheral regionP40. In some embodiments, the central region C40 may be defined based onthe outer surfaces 4200 s of the outermost semiconductor dies 4200,similar to what was previously discussed with reference to FIG. 4A. Thedummy dies 4310 may be disposed in the peripheral region P40 surroundingthe central region C40, for example forming one or more rings outsidethe central region C40. In some embodiments, additional dummy dies (notshown) not necessarily identical to the dummy dies 4310 may be disposedwithin the central region C40. Similar to what was previously discussedwith respect to FIG. 5A to FIG. 5D, in some embodiments it may bepossible to tune the vacancy ratios P42′, P44′, P46′ of the peripheralregions P42, P44, P46 by varying the number and the size of the dummydies 3310. For example, the semiconductor package SP42 includes fewerdummy dies 4310 further spaced apart from each other with respect to thedummy dies 4310 in the semiconductor package SP40. As another example,the semiconductor package SP44 includes fewer dummy dies 4320 than thenumber of dummy dies 4310 in the semiconductor package SP40. The dummydies 4320 have a larger footprint with respect to the dummy dies 3310included in the semiconductor packages SP40 and SP42. In yet anotherexample, the semiconductor package SP46 includes both the dummy dies4310 and the dummy dies 4320. For example, an outer (circular) ring (aframe) OR of smaller dummy dies 4310 may be disposed closer to the edgeE of the semiconductor package SP46, and an inner (circular) ring (aframe) IR of larger dummy dies 4320 may be disposed between the outerring OR and the border of the central region C46.

FIG. 8A to FIG. 8D are schematic cross-sectional views of thesemiconductor packages SP50, SP52, SP54, SP56, respectively, accordingto some embodiments of the disclosure. The cross-sectional views of FIG.8A to FIG. 8D are taken in an XY plane corresponding to the XY plane ofthe cross-sectional views of FIG. 6A to FIG. 6D. In some embodiments, adifference between the semiconductor packages SP50, SP52, SP54, SP56 andthe semiconductor packages SP30, SP32, SP34, SP36 of FIG. 6A to FIG. 6Dlies in that the semiconductor packages SP50, SP52, SP54, SP56 includemultiple functional semiconductor dies 5200 within the central regionsC50, C52, C54, C56. The sizes and functions of the semiconductor dies5200 may independently vary with respect to each other. As illustrated,for example, in FIG. 8A, the semiconductor package SP50 is a panel-sizesemiconductor package including the semiconductor die 5200 in the(rectangular) central region C50, and the dummy dies 5310 in theperipheral region P50. The dummy dies 5310 may be disposed in theperipheral region P50 surrounding the central region C50, for exampleforming one or more rings outside the central region C50. In someembodiments, additional dummy dies (not shown) not necessarily identicalto the dummy dies 5310 may be disposed within the central region C50.Similar to what was previously discussed with respect to FIG. 6A to FIG.6D, in some embodiments it may be possible to tune the vacancy ratiosP52, P54′, P56′ of the peripheral regions P52, P54, P56 by varying thenumber and the size of the dummy dies 5310. For example, thesemiconductor package SP52 includes fewer dummy dies 5310 further spacedapart from each other with respect to the dummy dies 5310 in thesemiconductor package SP50. As another example, the semiconductorpackage SP54 includes fewer dummy dies 5320 than the number of dummydies 5310 in the semiconductor package SP50. The dummy dies 5320 have alarger footprint with respect to the dummy dies 5310 included in thesemiconductor packages SP50 and SP52. In yet another example, thesemiconductor package SP56 includes both the dummy dies 5310 and thedummy dies 5320. For example, an outer (circular) ring (a frame) OR ofsmaller dummy dies 5310 may be disposed closer to the edge E of thesemiconductor package SP56, and an inner (circular) ring (a frame) IR oflarger dummy dies 5320 may be disposed between the outer ring OR and theborder of the central region C56.

FIG. 9A to FIG. 9D are schematic cross-sectional views of the wafer-sizesemiconductor packages SP60, SP62, SP64, SP66, respectively, accordingto some embodiments of the disclosure. The cross-sectional views of FIG.9A to FIG. 9D are taken in an XY plane corresponding to the XY plane ofthe cross-sectional views of FIG. 5A to FIG. 5D. In some embodiments, adifference between the semiconductor packages SP60, SP62, SP64, SP66 andthe semiconductor packages SP20, SP22, SP24, SP26 of FIG. 5A to FIG. 5Dlies in that the semiconductor packages SP60, SP62, SP64, SP66 includesone or more sub-packages 6200 within the central regions C60, C62, C64,C66. In some embodiments, each one of the sub-packages 6200 includes oneor more semiconductor dies 6210, 6220 encapsulated by an encapsulant6230. In some embodiments, the semiconductor dies 6210, 6220 included ina same sub-package 6200 may be interconnected to each other by aredistribution layer (not shown) included in the sub-package 6200. Thesub-packages 6200, in turn, may be interconnected to each other by theredistribution structures (not illustrated) of the correspondingsemiconductor packages SP60, SP62, SP64, SP66 (e.g., similar to what wasdiscussed with respect to the semiconductor dies 1200 and theredistribution structure 1600 for the semiconductor package SP10 of FIG.4A). The size, number, and function of the semiconductor dies 6210, 6220included in the sub-packages 6200 may independently vary, and thedisclosure does not pose any restriction in this regard. As illustrated,for example, in FIG. 9A, the semiconductor package SP60 is a wafer-sizesemiconductor package including the sub-packages 6200 in the centralregion C60, and the dummy dies 6310 in the peripheral region P60. Insome embodiments, the central region C60 may be defined with respect tothe outer surfaces 6200 s of the (outermost) sub-packages 6200,similarly to what was previously discussed with respect to the centralregion C10 with reference to FIG. 4A. The dummy dies 6310 may bedisposed in the peripheral region P60 surrounding the central regionC60, forming one or more rings outside the central region C60. In someembodiments, additional dummy dies (not shown) not necessarily identicalto the dummy dies 6310 may be disposed within the central region C60. Insome embodiments, the dummy dies 6310 and the sub-packages 6200 areencapsulated by a common encapsulant 6400. The encapsulant 6230 of thesub-packages 6200 and the encapsulant 6400 may include differentmaterials (e.g., different resins). However, the disclosure is notlimited thereto. In some alternative embodiments, the encapsulant 6230of the sub-packages 6200 and the encapsulant 6400 may include the samematerial. Similar to what was previously discussed with respect to FIG.5A to FIG. 5D, in some embodiments it may be possible to tune thevacancy ratios P62′, P64′, P66′ of the peripheral regions P62, P64, P66by varying the number and the size of the dummy dies 6310. For example,the semiconductor package SP62 includes fewer dummy dies 6310 furtherspaced apart from each other with respect to the dummy dies 6310 in thesemiconductor package SP60. As another example, the semiconductorpackage SP64 includes fewer dummy dies 6320 than the number of dummydies 6310 included in the semiconductor package SP60. The dummy dies6320 have a larger footprint with respect to the dummy dies 6310included in the semiconductor packages SP60 and SP62. In yet anotherexample, the semiconductor package SP66 includes both the dummy dies6310 and the dummy dies 6320. For example, an outer (circular) ring OR(a frame) of smaller dummy dies 6310 may be disposed closer to the edgeE of the semiconductor package SP66, and an inner (circular) ring IR (aframe) of larger dummy dies 6320 may be disposed between the outer ringOR and the border of the central region C66.

FIG. 10A to FIG. 10D are schematic cross-sectional views of thepanel-size semiconductor packages SP70, SP72, SP74, and SP76,respectively, according to some embodiments of the disclosure. Thecross-sectional views of FIG. 10A to FIG. 10D are taken in an XY planecorresponding to the XY plane of the cross-sectional views of FIG. 6A toFIG. 6D. In some embodiments, a difference between the semiconductorpackages SP70, SP72, SP74, and SP76 with respect to the semiconductorpackages SP30, SP32, SP34, SP36 of FIG. 6A to FIG. 6D lies in that thesemiconductor packages SP70, SP72, SP74, and SP76 include one or moresub-packages 7200 within the central regions C70, C72, C74, C76. Similarto the sub-packages 6200, each sub-package 7200 includes one or moresemiconductor dies 7210, 7220 encapsulated by an encapsulant 7230. Thesize, number, and function of the semiconductor dies 7210, 7220 includedin the sub-packages 7200 may independently vary, and the disclosure doesnot pose any restriction in this regard. As illustrated, for example, inFIG. 10A, the semiconductor package SP70 is a panel-size semiconductorpackage including the sub-packages 7200 in the central region C70, andthe dummy dies 7310 in the peripheral region P70. The dummy dies 7310may be disposed in the peripheral region P70 surrounding the centralregion C70, forming one or more rings outside the central region C70. Insome embodiments, additional dummy dies (not shown) not necessarilyidentical to the dummy dies 7310 may be disposed within the centralregion C70. Similar to what was previously discussed with respect toFIG. 6A to FIG. 6D, in some embodiments it may be possible to tune thevacancy ratios P72′, P74, P76′ of the peripheral regions P72, P74, P76by varying the number and the size of the dummy dies 7310. For example,the semiconductor package SP72 includes fewer dummy dies 7310 furtherspaced apart from each other with respect to the dummy dies 7310 in thesemiconductor package SP70. As another example, the semiconductorpackage SP74 includes fewer dummy dies 7320 than the number of dummydies 7310 included in the semiconductor package SP70. The dummy dies7320 have a larger footprint with respect to the dummy dies 7310included in the semiconductor packages SP70 and SP72. In yet anotherexample, the semiconductor package SP76 includes both the dummy dies7310 and the dummy dies 7320. For example, an outer (rectangular) ringOR (a frame) of smaller dummy dies 7310 may be disposed closer to theedge E of the semiconductor package SP76, and an inner (circular) ringIR (a frame) of larger dummy dies 7320 may be disposed between the outerring OR and the border of the central region C76.

FIG. 11 is a schematic cross-sectional view of the wafer-sizesemiconductor package SP80 according to some embodiments of thedisclosure. The cross-sectional view of FIG. 11 is taken in an XY planecorresponding to the XY plane of the cross-sectional views of FIG. 5A.In some embodiments, a difference between the semiconductor packagesSP80 and the semiconductor packages SP20 of FIG. 5A lies in that thesemiconductor package SP80 includes both the (bare) semiconductor dies8210 and the sub-packages 8220 within the central region C80. In someembodiments, each one of the sub-packages 8220 includes one or moresemiconductor dies 8221, 8222 encapsulated by an encapsulant 8223. Thesize, number, and function of the bare semiconductor dies 8210, ofsub-packages 8220, and of the semiconductor dies 8221, 8222 included ineach sub-package 8220 may independently vary, and the disclosure doesnot pose any restriction in this regard. As illustrated, for example, inFIG. 11 , the semiconductor package SP80 is a wafer-size semiconductorpackage including the bare semiconductor dies 8210 and the sub-packages8220 disposed side by side within the central region C80. The dummy dies8310 are disposed in the peripheral region P80, for example forming oneor more rings surrounding the central region C80. In some embodiments,additional dummy dies (not shown) not necessarily identical to the dummydies 8310 may be disposed within the central region C80. In someembodiments, it may be possible to tune the vacancy ratio P80′ of theperipheral region P80 by varying the number and the size of the dummydies 8310 in a similar fashion as previously described with reference toFIG. 5A to FIG. 5D.

In accordance with some embodiments of the disclosure, a semiconductorpackage has a central region and a peripheral region. The peripheralregion surrounds the central region. The semiconductor package includesdies, an encapsulant, and a redistribution structure. The dies include afunctional die and first dummy dies. The functional die is disposed inthe central region. The first dummy dies are disposed in the peripheralregion. The redistribution structure is disposed on the encapsulant overthe dies, and is electrically connected to the functional die. A vacancyratio of the central region is in the range from 1.01 to 3.00. A vacancyratio of the peripheral region is in the range from 1.01 to 3.00. Thevacancy ratio of the central region is a ratio of a total area of thecentral region to a total area occupied by the dies disposed in thecentral region. The vacancy ratio of the peripheral region is a ratio ofa total area of the peripheral region to a total area occupied by thefirst dummy dies disposed in the peripheral region.

In accordance with some embodiments of the disclosure, a semiconductorpackage has a central region and a peripheral region. The peripheralregion is disposed around the central region and extends from thecentral region to an edge of the semiconductor package. Thesemiconductor package includes first dies, second dies, an encapsulant,and a redistribution structure. The first dies are disposed in thecentral region. The second dies are disposed in the peripheral region.The encapsulant encapsulates the first dies and the second dies. Theredistribution structure is disposed over the encapsulant. Theredistribution structure includes conductive traces. The first diesinclude first functional dies electrically connected to the conductivetraces of the redistribution structure. A border between the peripheralregion and the central region passes on outer surfaces of outermostfirst functional dies. The outermost first functional dies are firstfunctional dies radially closer to the edge of the semiconductor packageamongst the first functional dies. The outer surfaces are surfacesfacing the edge of the semiconductor package without other firstfunctional dies interposed with respect to the edge. A ratio of a totalarea of the central region to a total area of the peripheral regionmultiplied by a ratio of a total area occupied by the second dies in theperipheral region to a total area occupied by the first dies in thecentral region is in the range between 0.3 to 3.0.

In accordance with some embodiments of the disclosure, a manufacturingmethod of a semiconductor package includes the following steps. Firstdies are disposed on a carrier. Second dies are disposed on the carrierbeside the first dies. The first dies and the second dies are molded inan encapsulant. Dielectric layers and metallization tiers are formedalternately stacked on the encapsulant. The metallization tiers compriseconductive traces electrically contacting at least one die of the firstdies. The first dies are disposed in a first region of the semiconductorpackage. The second dies are disposed in a second region of thesemiconductor package. In the semiconductor package, a first ratio of atotal area of a first region to a total area occupied by the first diesis in the range from 1.01 to 3.00. A second ratio of a total area of asecond region to a total area occupied by the second dies is in therange from 1.01 to 3.00. A combined area of the total area of the firstregion and the total area of the second region coincides with a totalarea of the semiconductor package. A third ratio of the first ratio tothe second ratio is in the range from 0.3 to 3.0.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A semiconductor package, having a central regionand a peripheral region surrounding the central region, thesemiconductor package comprising: dies, wherein the dies include: afunctional die disposed in the central region; and first dummy diesdisposed in the peripheral region; and an encapsulant encapsulating thedies, wherein the encapsulant is a first encapsulant, the functional dieis one of a pair of functional dies, the pair of functional dies isencapsulated by a second encapsulant different from the firstencapsulant in a sub-package, and the sub-package is encapsulated by thefirst encapsulant, and wherein a size of the functional dies isdifferent from a size of the first dummy dies.
 2. The semiconductorpackage of claim 1, wherein a vacancy ratio of the central region isdifferent from a vacancy ratio of the peripheral region.
 3. Thesemiconductor package of claim 2, wherein a ratio of the vacancy ratioof the central region to the vacancy ratio of the peripheral region isin the range from 0.3 to 3.0.
 4. The semiconductor package of claim 1,further comprising bare semiconductor dies within the central region. 5.The semiconductor package of claim 1, wherein the dies include multiplepairs of functional dies.
 6. The semiconductor package of claim 5,wherein the multiple pairs of functional dies are arranged in an array.7. The semiconductor package of claim 6, wherein a border between thecentral region and the peripheral region coincides with a perimeter ofthe array.
 8. A semiconductor package, having a central region and aperipheral region disposed around the central region and extending fromthe central region to an edge of the semiconductor package, thesemiconductor package comprising: first dies disposed in the centralregion; second dies disposed in the peripheral region; and anencapsulant, encapsulating the first dies and the second dies, whereinthe first dies comprise first functional dies, wherein the firstfunctional dies are disposed along rows and columns of an array, and thefirst dies further include first dummy dies disposed along intersectinglines in between adjacent rows and columns of the first functional dies,and wherein the second dies comprise second dummy dies and third dummydies, and a footprint of the second dummy dies is different from afootprint of the third dummy dies.
 9. The semiconductor package of claim8, wherein the footprint of the second dummy dies is larger than thefootprint of the third dummy dies.
 10. The semiconductor package ofclaim 8, wherein the third dummy dies are disposed along the edge of thesemiconductor package, and the second dummy dies are disposed as a ringbetween the third dummy dies and the outermost first functional dies.11. The semiconductor package of claim 8, wherein a through hole spaceis present at an intersection between two intersecting linesperpendicular to each other.
 12. The semiconductor package of claim 11,wherein no die is disposed at the through hole space.
 13. Thesemiconductor package of claim 8, wherein a ratio of a radial width ofthe central region to a radial width of the peripheral region is in therange from 0.5 to 2.0.
 14. The semiconductor package of claim 8, whereinat least one first functional die is a passive device.
 15. Amanufacturing method of a semiconductor package, the method comprising:disposing first dies on a carrier; disposing second dies on the carrierbeside the first dies; and molding the first dies and the second dies inan encapsulant; wherein, in the semiconductor package, the first diesare disposed in a first region of the semiconductor package; the seconddies are disposed in a second region of the semiconductor package;wherein the first dies include third dies and fourth dies, and whereindisposing the first dies comprises: disposing the third dies on thecarrier along rows and columns of an array; and disposing the fourthdies in between the rows and columns of the array, wherein a borderbetween the first region and the second region is delimited by aperimeter of the array, and wherein the second dies comprise dummy dieswith two different sizes.
 16. The manufacturing method of claim 15,further comprising: forming alternately stacked dielectric layers andmetallization tiers on the encapsulant, wherein the metallization tierscomprise conductive traces electrically contacting the third dies of thefirst dies.
 17. The manufacturing method of claim 16, wherein the fourthdies of the first dies are electrically insulated from the metallizationtiers.
 18. The manufacturing method of claim 16, further comprisingdisposing connective terminals on an opposite side of the stackeddielectric layers and metallization tiers with respect to the firstdies.
 19. The manufacturing method of claim 15, wherein a first ratio ofa total area of the first region to a total area occupied by the firstdies is in the range from 1.01 to 3.00.
 20. The manufacturing method ofclaim 15, wherein a second ratio of a total area of the second region toa total area occupied by the second dies is in the range from 1.01 to3.00.